Title :
Optimal accelerated life-time plans that minimize the maximum test-stress
Author :
Barton, Russell R.
Author_Institution :
Dept. of Ind. & Manage. Syst. Eng., Pennsylvania State Univ., University Park, PA, USA
fDate :
6/1/1991 12:00:00 AM
Abstract :
The author proposes a variation of the optimum accelerated life test plans described by Nelson and others, and shows how to minimize the maximum test-stress that is required, subject to meeting a certain standard-deviation limit on the estimate. Previous optimal life-test plans have shown how to minimize the standard-deviation of the estimated product life, subject to a given maximum test-stress
Keywords :
failure analysis; life testing; minimax techniques; reliability theory; accelerated life test plans; failure mechanisms; maximum test stress minimisation; optimal life-test plans; reliability; Acceleration; Failure analysis; Life estimation; Life testing; Meeting planning; Probability distribution; Statistical analysis; Stress; Temperature; Voltage;
Journal_Title :
Reliability, IEEE Transactions on
