DocumentCode
1386992
Title
Optimal accelerated life-time plans that minimize the maximum test-stress
Author
Barton, Russell R.
Author_Institution
Dept. of Ind. & Manage. Syst. Eng., Pennsylvania State Univ., University Park, PA, USA
Volume
40
Issue
2
fYear
1991
fDate
6/1/1991 12:00:00 AM
Firstpage
166
Lastpage
172
Abstract
The author proposes a variation of the optimum accelerated life test plans described by Nelson and others, and shows how to minimize the maximum test-stress that is required, subject to meeting a certain standard-deviation limit on the estimate. Previous optimal life-test plans have shown how to minimize the standard-deviation of the estimated product life, subject to a given maximum test-stress
Keywords
failure analysis; life testing; minimax techniques; reliability theory; accelerated life test plans; failure mechanisms; maximum test stress minimisation; optimal life-test plans; reliability; Acceleration; Failure analysis; Life estimation; Life testing; Meeting planning; Probability distribution; Statistical analysis; Stress; Temperature; Voltage;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.87122
Filename
87122
Link To Document