DocumentCode :
1387486
Title :
A Novel Accurate Pattern Fitting of Noisy Irregular Beam Data for the Planck Space Telescope
Author :
Borries, Oscar ; Jensen, Frank ; Nielsen, Per Heighwood ; Tauber, Jan ; Martín-Polegre, Arturo
Author_Institution :
TICRA, Copenhagen, Denmark
Volume :
54
Issue :
6
fYear :
2012
fDate :
12/1/2012 12:00:00 AM
Firstpage :
232
Lastpage :
238
Abstract :
Fitting using Kriging, originally developed for geological exploitation, has here been applied for fitting an expected pattern to noisy, irregular, in-flight measurements of a satellite antenna. The noise level in in-flight measurements is often so high that only the central part of the main beam appears. Using the Kriging method, a characteristic function - the regression model - was first fitted to the measurements. For the main beam, this was chosen to be described by a general second-order polynomial. To this was added a more-detailed correlation model, which represented realistic deviations from the regression model but filtered out the fast variations of the noise. The method was applied to simulated measurements of the Planck RF telescope. The results presented showed a considerable reduction of the noise floor of the pattern: even beam details invisible in the original measurements (a shoulder) were revealed by the pattern fitting.
Keywords :
antenna arrays; astronomical telescopes; geophysical techniques; polynomials; regression analysis; satellite antennas; Kriging method; Planck RF telescope; Planck space telescope; general second-order polynomial; in-flight measurements; noise floor; noise level; noisy irregular beam data; pattern fitting; regression model; satellite antenna; Aerospace electronics; Antenna measurements; Antenna radiation patterns; Curve fitting; Pattern recognition; Satellites; Antenna radiation patterns; Kriging; antenna measurements; curve fitting; in-flight testing; millimeter wave measurements; pattern reconstruction; satellite antennas;
fLanguage :
English
Journal_Title :
Antennas and Propagation Magazine, IEEE
Publisher :
ieee
ISSN :
1045-9243
Type :
jour
DOI :
10.1109/MAP.2012.6387831
Filename :
6387831
Link To Document :
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