Dependence of perpendicular coercivity on residual stress of Ba ferrite/ZnO bilayered films deposited on fused quartz substrate

Author

Noma, Kelljl ; Matsushita, Nobuhiro ; Nakagawa, Shigeki ; Naoe, Masahlko

Author_Institution

Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan

Volume

32

Issue

5

fYear

1996

fDate

9/1/1996 12:00:00 AM

Firstpage

3822

Lastpage

3824

Abstract

Ba ferrite films composed of perfectly c-axis oriented crystallites, perpendicular to film plane, were deposited on fused quartz sheets with ZnO underlayer at substrate temperature of 150°C. It was found that the creation of microcracks due to the large residual stress in the films was sufficiently suppressed by depositing the ZnO layer at a substrate temperature of 450°C and by reducing the thickness of ZnO layer. The stress also increased the perpendicular coercivity due to the magnetostriction effect. These results suggest that the thickness of the Ba ferrite and ZnO layers should be reduced to decrease magnetostrictive demagnetization to be suitable for the application to high density magnetic recording media

Keywords

barium compounds; coercive force; demagnetisation; ferrites; internal stresses; magnetic thin films; magnetostriction; microcracks; perpendicular magnetic anisotropy; sputtered coatings; zinc compounds; 150 C; 450 C; Ba ferrite/ZnO bilayered film; BaFe₁₂O₁₉-ZnO; SiO₂; demagnetization; fused quartz substrate; high density magnetic recording; magnetostriction; microcracks; perpendicular coercivity; residual stress; Coercive force; Crystallization; Demagnetization; Ferrite films; Magnetostriction; Perpendicular magnetic recording; Residual stresses; Substrates; Temperature dependence; Zinc oxide;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.539184

Filename

539184