• DocumentCode
    1387663
  • Title

    AC Susceptibility Studies of Anisotropy in Sm-123 Superconductors

  • Author

    Sakamoto, Nobuyoshi ; Akune, Tadahiro

  • Author_Institution
    Dept. of the Electr. Eng. & Inf. Technol., Kyushu Sangyo Univ., Fukuoka, Japan
  • Volume
    21
  • Issue
    3
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    3142
  • Lastpage
    3145
  • Abstract
    The main cause of the degradation in the oxide superconductors is considered to originate in the inter-granular link region among the superconducting grains. For analytical study of the granular structure, the grained Bean model is proposed, where the superconducting grains are immersed in the interconnecting link superconductors. Difference of the superconducting characteristics of the grain and the link, pinning penetration depths Bpg, Bpl and grain volume factor fg, introduces a variety of deformation on the AC susceptibility curves, such as double peaks in the imaginary part χ´´ and plateaus in the real part χ´. From the dependence of χ´ and χ´´ of AC susceptibility on temperatures T and DC magnetic fields Bdc in grain-aligned Sm-123 superconductors, critical current densities, grain sizes and their anisotropic nature can be estimated and discussed comparing with the existing data.
  • Keywords
    Bean model; critical current density (superconductivity); flux pinning; grain size; high-temperature superconductors; samarium compounds; AC susceptibility; anisotropy; critical current density; grain size; grain volume factor; grained Bean model; granular structure; interconnecting link superconductor; oxide superconductor; pinning penetration depth; superconducting grain; susceptibility curve; Bean model; Granular superconductors; Magnetic resonance imaging; Magnetic susceptibility; Magnetization; Superconducting magnets; AC susceptibility; grained Bean model; pinning penetration field;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2010.2089670
  • Filename
    5643960