DocumentCode :
1387678
Title :
Modeling Thermal Fatigue in CPV Cell Assemblies
Author :
Bosco, Nick ; Silverman, Timothy J. ; Kurtz, Sarah
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
Volume :
1
Issue :
2
fYear :
2011
Firstpage :
242
Lastpage :
247
Abstract :
A finite-element (FEM) model has been created to quantify the thermal fatigue damage of the concentrating photovoltaic (CPV) die attach. Simulations are used to compare the results of empirical thermal fatigue equations that have originally been developed for accelerated chamber cycling. While the empirical equations show promise when extrapolated to the lower temperature cycles characteristic of weather-induced temperature changes in the CPV die attach, it is demonstrated that their damage does not accumulate linearly: The damage that a particular cycle contributes depends on the preceding cycles. Direct comparison of the FEM with empirical methods and calculation of equivalent times for standard accelerated test sequences were made using CPV cell temperature histories.
Keywords :
finite element analysis; microassembling; solar cells; thermal stress cracking; CPV cell assemblies; accelerated chamber cycling; concentrating photovoltaic die attach; empirical equations; equivalent times; finite element model; temperature cycles; thermal fatigue damage; weather-induced temperature changes; Fatigue; Finite element methods; Mathematical model; Microassembly; Concentrating photovoltaics (CPV); fintie element model (FEM);
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2011.2172575
Filename :
6094152
Link To Document :
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