• DocumentCode
    1387777
  • Title

    Contamination build-up on ABS and its effects on read/write performance of near-contact recording systems

  • Author

    Liu, Bo ; Hu, S.B. ; Soo, K.T. ; Wang, J.P. ; Ng, S.H. ; Lee, C.S.

  • Author_Institution
    Data Storage Inst., Nat. Univ. of Singapore, Singapore
  • Volume
    32
  • Issue
    5
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    3884
  • Lastpage
    3886
  • Abstract
    This paper reports results of experimental investigations of contamination build-up on slider surfaces and its effects on the performance of tri-pad slider-based near-contact recording systems. Results indicate that the head-disk clearance changes, caused by contamination build-up, can be comparable to the designed head-disk clearance. As a result, the drive´s performance and reliability can be strongly affected. Results obtained show that the amount of increase in the value of transition region length parameter is greater than the corresponding increase in head-disk clearance. Consequently, the writing performance suffers more severe degradation than the read performance. This is shown by error-rate measurements at the drive level as well as PW50 and NLTS measurements at the component level
  • Keywords
    error statistics; lubrication; magnetic heads; magnetic recording; magnetic recording noise; surface contamination; ABS contamination build-up; NLTS; PW50; air bearing surfaces; disk drive performance; disk drive reliability; error-rate measurements; flying height variation; head-disk clearance changes; lubricant; near-contact recording systems; read performance; read/write performance; slider surfaces; transition region length parameter; tri-pad slider; writing performance; Degradation; Disk drives; Disk recording; Error analysis; Lubricants; Magnetic recording; Pollution measurement; Surface contamination; Velocity measurement; Writing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.539205
  • Filename
    539205