Title :
Direct characterization of ultraviolet-light-induced refractive index structures by scanning near-field optical microscopy
Author :
Svalgaard, M. ; Madsen, S. ; Hvam, J.M. ; Kristensen, M.
Author_Institution :
Mikroelektronik Centret, Tech. Univ. Denmark, Lyngby, Denmark
fDate :
6/1/1998 12:00:00 AM
Abstract :
We have applied a reflection scanning near-field optical microscope to directly probe ultraviolet (UV)-light-induced refractive index structures in planar glass samples. This technique permits direct comparison between topography and refractive index changes (10/sup -5/-10/sup -3/) with submicrometer lateral resolution. The proposed method yields detailed information about the topography and index profiles of UV-written waveguides.
Keywords :
laser beam effects; optical glass; optical microscopy; optical resolving power; optical scanners; refractive index; UV-light-induced refractive index structure probing; UV-written waveguides; direct characterization; index profiles; planar glass samples; reflection scanning near-field optical microscope; refractive index changes; scanning near-field optical microscopy; submicrometer lateral resolution; topography; ultraviolet-light-induced refractive index structures; Atom optics; Glass; Optical films; Optical microscopy; Optical refraction; Optical surface waves; Optical variables control; Optical waveguides; Probes; Refractive index;
Journal_Title :
Photonics Technology Letters, IEEE
