Direct characterization of ultraviolet-light-induced refractive index structures by scanning near-field optical microscopy

Author

Svalgaard, M. ; Madsen, S. ; Hvam, J.M. ; Kristensen, M.

Author_Institution

Mikroelektronik Centret, Tech. Univ. Denmark, Lyngby, Denmark

Volume

10

Issue

6

fYear

1998

fDate

6/1/1998 12:00:00 AM

Firstpage

848

Lastpage

850

Abstract

We have applied a reflection scanning near-field optical microscope to directly probe ultraviolet (UV)-light-induced refractive index structures in planar glass samples. This technique permits direct comparison between topography and refractive index changes (10/sup -5/-10/sup -3/) with submicrometer lateral resolution. The proposed method yields detailed information about the topography and index profiles of UV-written waveguides.

Keywords

laser beam effects; optical glass; optical microscopy; optical resolving power; optical scanners; refractive index; UV-light-induced refractive index structure probing; UV-written waveguides; direct characterization; index profiles; planar glass samples; reflection scanning near-field optical microscope; refractive index changes; scanning near-field optical microscopy; submicrometer lateral resolution; topography; ultraviolet-light-induced refractive index structures; Atom optics; Glass; Optical films; Optical microscopy; Optical refraction; Optical surface waves; Optical variables control; Optical waveguides; Probes; Refractive index;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.681506

Filename

681506