DocumentCode
1388201
Title
Theoretical investigation of magnetization configuration and reversal processes in exchange-coupled multilayers
Author
Sbiaa, R. ; Gall, H. Le ; Braïk, Y. ; Yurchenko, S. ; El Harfaoui, M.
Author_Institution
LMIMS, CNRS, Meudon, France
Volume
32
Issue
5
fYear
1996
fDate
9/1/1996 12:00:00 AM
Firstpage
4073
Lastpage
4075
Abstract
An analytic study of magnetization profiles and reversal processes is performed in exchange-coupled double and trilayers (ECDL and ECTL) corresponding to mixed parallel and perpendicular anisotropy structures (M1/M2) and (M2/M1/M2 ) where M1 corresponds to planar magnetization layers NdCo or GdFeCo and M2 are perpendicular magnetization layers TbFeCo or DyFeCo. The changes of the profiles with magnetic parameters of the layers are calculated from a variational method of the magnetic energies in a continuum model in ECDL and from a noncontinuum model method in ECTL. The effective exchange field induced at the interface by the capping layer M1 for thickness higher than a critical value is calculated and its influence on the reversal process of the “perpendicular” layer M2 is determined in ECDL. Both the continuous and noncontinuous models are useful to optimize magnetooptical structures and the results from these models are compared
Keywords
amorphous magnetic materials; cobalt alloys; dysprosium alloys; exchange interactions (electron); gadolinium alloys; iron alloys; magnetic anisotropy; magnetic multilayers; magnetisation reversal; magneto-optical recording; neodymium alloys; perpendicular magnetic anisotropy; terbium alloys; DyFeCo-NdCo-DyFeCo; GdFeCo-DyFeCo; NdCo-DyFeCo; TbFeCo; capping layer; continuum model; effective exchange field; exchange-coupled double layers; exchange-coupled multilayers; exchange-coupled trilayers; magnetic energies; magnetic parameters; magnetization configuration; magnetization profiles; magnetooptical recording; magnetooptical structures; mixed structures; noncontinuum model; parallel anisotropy structures; perpendicular anisotropy structures; planar magnetization layers; reversal processes; thickness; variational method; Amorphous magnetic materials; Anisotropic magnetoresistance; Magnetic analysis; Magnetic films; Magnetic multilayers; Magnetic properties; Magnetooptic effects; Performance analysis; Perpendicular magnetic recording; Saturation magnetization;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.539267
Filename
539267
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