• DocumentCode
    1388336
  • Title

    The duality that relates magnetic noise to electric shot noise

  • Author

    Kaplan, Ben-zion ; Paperno, Eugene ; Frumkis, Lev

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
  • Volume
    32
  • Issue
    5
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    4914
  • Lastpage
    4916
  • Abstract
    Statistical treatment of the succession in time of the Barkhausen-noise pulses shows that magnetic noise possesses characteristics that are similar to those of electric shot noise. On the other hand, the electric shot-noise intensity in a noisy component is known to be related directly to the square root of the dc current through the component. Hence, it is intriguing to relate in the same manner the magnetic-noise flux-fluctuations to a magnetic entity similar to the dc current in the electric case. The present work is a successful attempt to demonstrate that such relationship exists. This is attained by employing the duality that relates the time-derivative of the magnetic flux to the electric current. The magnetic noise measurements of commercially available thin-film magnetoresistors confirm the applicability of the proposed approach. The noise was generated by exciting the magnetoresistors by an ac magnetic field along their easy axes. The level of the resulted flux time-derivative was changed by varying the excitation frequency
  • Keywords
    Barkhausen effect; magnetic noise; magnetoresistive devices; shot noise; thin film resistors; AC magnetic field; Barkhausen noise pulse; DC current; duality; easy axis; electric shot noise; flux fluctuations; magnetic noise; statistical analysis; thin-film magnetoresistor; AC generators; Current; Frequency; Magnetic field measurement; Magnetic films; Magnetic flux; Magnetic noise; Magnetoresistive devices; Noise generators; Noise measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.539286
  • Filename
    539286