DocumentCode :
1388653
Title :
Quantitative assessments for transient voltage security
Author :
Xue, Yusheng ; Xu, Taishan ; Liu, Bing ; Li, Yaozong
Author_Institution :
Nanjing Autom. Res. Inst., China
Volume :
15
Issue :
3
fYear :
2000
fDate :
8/1/2000 12:00:00 AM
Firstpage :
1077
Lastpage :
1083
Abstract :
Transient voltage security means that the system is both transient voltage stable and transient voltage dips acceptable. The definitions are clarified in this paper. Self start technique for computing transient-voltage-stability-related limits is proposed. Based on a margin for transient voltage dip acceptability, a criterion for early termination of the simulation is put forward. Moreover, the procedure of calculating critical clearing time for transient voltage security is extended to that of calculating the critical load level, the minimum reactive power resources and minimum load shedding for keeping transient voltage security. It is also suggested that transient angle stability and transient voltage stability and transient voltage dip acceptability be quantitatively assessed along the same simulation trajectory. The most critical one among the three kinds of limits is regarded as the global transient security limit. The effectiveness and robustness of the proposed approach are demonstrated in this paper with statistic information resulting from 47987 test cases on two practical power systems
Keywords :
load shedding; power system transient stability; reactive power; critical clearing time; global transient security limit; minimum load shedding; minimum reactive power resources; power systems; quantitative assessments; security limits; security margin; self start technique; transient angle stability; transient voltage dip acceptability; transient voltage security; Computational modeling; Information security; Power system security; Power system simulation; Power system transients; Reactive power; Robustness; Stability; Statistical analysis; Voltage fluctuations;
fLanguage :
English
Journal_Title :
Power Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8950
Type :
jour
DOI :
10.1109/59.871736
Filename :
871736
Link To Document :
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