DocumentCode :
1388746
Title :
Defect images by planar ECT probe of meander-mesh coils
Author :
Yamada, Sotoshi ; Katou, Masaki ; Iwahara, Masayoshi ; Dawson, Francis P.
Author_Institution :
Lab. of Magnetic Field Control & Appl., Kanazawa Univ., Japan
Volume :
32
Issue :
5
fYear :
1996
fDate :
9/1/1996 12:00:00 AM
Firstpage :
4956
Lastpage :
4958
Abstract :
This paper presents results pertaining to image data obtained from a planar meander-mesh coupled coil type ECT probe. The image data makes it possible to detect not only the existence of a defect but also to extract detailed information regarding the nature of the defect, such as its position, shape, length, and direction. In order to recognize a defect distinctly, we have fabricated the high sensitive planar coil which can be used to image a 2-D representation of the ECT signal. The relationships between the image pattern and defect shape are discussed
Keywords :
coils; eddy current testing; flaw detection; defect shape; meander-mesh coupled coil; planar ECT probe; two-dimensional imaging; Coils; Eddy currents; Electrical capacitance tomography; Etching; Magnetic fields; Magnetic flux; Magnetic noise; Magnetic shielding; Probes; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.539300
Filename :
539300
Link To Document :
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