DocumentCode :
1389388
Title :
Integrated Behavior Simulation and Verification for a MEMS Vibratory Gyroscope Using Parametric Model Order Reduction
Author :
Chang, Honglong ; Zhang, Yafei ; Xie, Jianbing ; Zhou, Zhiguang ; Yuan, Weizheng
Author_Institution :
Micro & Nano Electromech. Syst. Lab., Northwestern Polytech. Univ., Xi´´an, China
Volume :
19
Issue :
2
fYear :
2010
fDate :
4/1/2010 12:00:00 AM
Firstpage :
282
Lastpage :
293
Abstract :
In this paper, a parameterized reduced model of a vibratory microelectromechanical systems (MEMS) gyroscope is established using a parametric model order reduction algorithm. In the reduction process, not only the input angular velocity, material density, Young´s modulus, and Rayleigh damping coefficient but also the coefficient of thermal expansion and the change in temperature were all preserved. Based on this model, the integrated behavior simulation of the MEMS gyroscope, including many environmental factors in engineering situations, was performed in an accurate and fast way. Compared with the finite-element method, the relative error of the reduced-order model was less than 4.2%, while the computational efficiency was improved about five times. The cosimulation with a complete interface circuit was successfully performed in a very fast way, which provides a convenient platform for designers to evaluate the performance of sensors. The experimental verification proves that the reduced model can provide a reliable simulation result, although some errors exist.
Keywords :
Young´s modulus; gyroscopes; micromechanical devices; microsensors; thermal expansion; MEMS vibratory gyroscope; Rayleigh damping coefficient; Young´s modulus; input angular velocity; interface circuit; material density; microelectromechanical systems; parametric model order reduction; sensors; thermal expansion; Behavior simulation; macromodel; microelectromechanical systems (MEMS); parametric model order reduction (PMOR); vibratory gyroscope;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2009.2038284
Filename :
5393089
Link To Document :
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