Measurement of thermal conductivities of SiN and TbFeCo films

Author

Kim, Seong-Sue ; Ahn, Young-Man ; Lee, Kymg-Gem ; Bueung-Lyong Gill ; Shin, Sung-Chul

Author_Institution

Opt. Storage Media Lab., Samsung Adv. Inst. of Technol., Suwon, South Korea

Volume

32

Issue

5

fYear

1996

fDate

9/1/1996 12:00:00 AM

Firstpage

4093

Lastpage

4095

Abstract

The effective thermal conductivities of SiN and TbFeCo thin films were measured by comparing the length and width of a polarizing microscope image of thermo-magnetically written domains with those of calculated isotherms for the trilayer structure of substrate/Si₃N₄/Tb₂₂Fe₇₀Co₈/Si ₃N₄. The resulting data were applied to the quadrilayer structure of substrate/Si₃N₄/Tb₂₂Fe₇₀Co₈/Si₃N₄/Al, and the length of the calculated isotherms turned out to agree with that of the written domain

Keywords

aluminium; cobalt alloys; coercive force; ferrimagnetic materials; iron alloys; magnetic domains; magnetic multilayers; magneto-optical recording; silicon compounds; terbium alloys; thermal conductivity; Si₃N₄-Tb₂₂Fe₇₀Co ₈-Si₃N₄; Si₃N₄-Tb₂₂Fe₇₀Co ₈-Si₃N₄-Al; TbFeCo thin film; coercivity; effective thermal conductivities; isotherms; polarizing microscope image; quadrilayer structure; substrate/Si₃N₄/Tb₂₂Fe₇₀Co₈/Si₃N₄; substrate/Si₃N₄/Tb₂₂Fe₇₀Co₈/Si₃N₄/Al; thermal conductivities measurement; thermo-magnetically written domains; trilayer structure; Conducting materials; Conductive films; Conductivity measurement; Magnetic domains; Optical films; Optical materials; Silicon compounds; Temperature dependence; Thermal conductivity; Writing;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.539309

Filename

539309