Title :
Measurement of thermal conductivities of SiN and TbFeCo films
Author :
Kim, Seong-Sue ; Ahn, Young-Man ; Lee, Kymg-Gem ; Bueung-Lyong Gill ; Shin, Sung-Chul
Author_Institution :
Opt. Storage Media Lab., Samsung Adv. Inst. of Technol., Suwon, South Korea
fDate :
9/1/1996 12:00:00 AM
Abstract :
The effective thermal conductivities of SiN and TbFeCo thin films were measured by comparing the length and width of a polarizing microscope image of thermo-magnetically written domains with those of calculated isotherms for the trilayer structure of substrate/Si3 N4/Tb22Fe70Co8/Si 3N4. The resulting data were applied to the quadrilayer structure of substrate/Si3N4/Tb22 Fe70Co8/Si3N4/Al, and the length of the calculated isotherms turned out to agree with that of the written domain
Keywords :
aluminium; cobalt alloys; coercive force; ferrimagnetic materials; iron alloys; magnetic domains; magnetic multilayers; magneto-optical recording; silicon compounds; terbium alloys; thermal conductivity; Si3N4-Tb22Fe70Co 8-Si3N4; Si3N4-Tb22Fe70Co 8-Si3N4-Al; TbFeCo thin film; coercivity; effective thermal conductivities; isotherms; polarizing microscope image; quadrilayer structure; substrate/Si3N4/Tb22Fe70 Co8/Si3N4; substrate/Si3N4/Tb22Fe70 Co8/Si3N4/Al; thermal conductivities measurement; thermo-magnetically written domains; trilayer structure; Conducting materials; Conductive films; Conductivity measurement; Magnetic domains; Optical films; Optical materials; Silicon compounds; Temperature dependence; Thermal conductivity; Writing;
Journal_Title :
Magnetics, IEEE Transactions on
