DocumentCode :
1389432
Title :
Accurate Timing and Noise Analysis of Combinational and Sequential Logic Cells Using Current Source Modeling
Author :
Nazarian, Shahin ; Fatemi, Hanif ; Pedram, Massoud
Author_Institution :
Univ. of Southern California, Los Angeles, CA, USA
Volume :
19
Issue :
1
fYear :
2011
Firstpage :
92
Lastpage :
103
Abstract :
A current source model (CSM) for CMOS logic cells is presented, which can be used for accurate noise and delay analysis in CMOS VLSI circuits. CS modeling is broadly considered as the method of choice for modern static timing and noise analysis tools. Unfortunately, the existing CSMs are only applicable to combinational logic cells. In addition to multistage logic nature of the sequential cells, the main difficulty in developing a CSM for these cells is the presence of feedback loops. This paper begins by presenting a highly accurate CSM for combinational logic cells, followed by models for common sequential cells, including latches and master slave flip-flops. The proposed model addresses these problems by characterizing the cell with suitable nonlinear CSs and capacitive components. Given the input and clock voltage waveforms of arbitrary shapes, our new model can accurately compute the output voltage waveform of the sequential cell. Experimental results demonstrate close-to-SPICE waveforms with three orders of magnitude speedup.
Keywords :
CMOS logic circuits; VLSI; circuit feedback; circuit noise; combinational circuits; flip-flops; sequential circuits; CMOS VLSI circuits; CMOS logic cells; clock voltage waveform; close-to-SPICE waveforms; combinational logic cells; current source modeling; delay analysis; feedback loops; input voltage waveform; master slave flip-flops; noise analysis; output voltage waveform; sequential logic cells; CMOS logic circuits; Circuit noise; Combinational circuits; Delay; Feedback loop; Semiconductor device modeling; Sequential circuits; Timing; Very large scale integration; Voltage; Crosstalk noise; current source model (CSM); static timing analysis (STA);
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2009.2024945
Filename :
5393095
Link To Document :
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