• DocumentCode
    1389432
  • Title

    Accurate Timing and Noise Analysis of Combinational and Sequential Logic Cells Using Current Source Modeling

  • Author

    Nazarian, Shahin ; Fatemi, Hanif ; Pedram, Massoud

  • Author_Institution
    Univ. of Southern California, Los Angeles, CA, USA
  • Volume
    19
  • Issue
    1
  • fYear
    2011
  • Firstpage
    92
  • Lastpage
    103
  • Abstract
    A current source model (CSM) for CMOS logic cells is presented, which can be used for accurate noise and delay analysis in CMOS VLSI circuits. CS modeling is broadly considered as the method of choice for modern static timing and noise analysis tools. Unfortunately, the existing CSMs are only applicable to combinational logic cells. In addition to multistage logic nature of the sequential cells, the main difficulty in developing a CSM for these cells is the presence of feedback loops. This paper begins by presenting a highly accurate CSM for combinational logic cells, followed by models for common sequential cells, including latches and master slave flip-flops. The proposed model addresses these problems by characterizing the cell with suitable nonlinear CSs and capacitive components. Given the input and clock voltage waveforms of arbitrary shapes, our new model can accurately compute the output voltage waveform of the sequential cell. Experimental results demonstrate close-to-SPICE waveforms with three orders of magnitude speedup.
  • Keywords
    CMOS logic circuits; VLSI; circuit feedback; circuit noise; combinational circuits; flip-flops; sequential circuits; CMOS VLSI circuits; CMOS logic cells; clock voltage waveform; close-to-SPICE waveforms; combinational logic cells; current source modeling; delay analysis; feedback loops; input voltage waveform; master slave flip-flops; noise analysis; output voltage waveform; sequential logic cells; CMOS logic circuits; Circuit noise; Combinational circuits; Delay; Feedback loop; Semiconductor device modeling; Sequential circuits; Timing; Very large scale integration; Voltage; Crosstalk noise; current source model (CSM); static timing analysis (STA);
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2009.2024945
  • Filename
    5393095