• DocumentCode
    1389593
  • Title

    The electrically ruptured area of crosslinked polyethylene

  • Author

    Lee, Y.D. ; Phillips, P.J.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Tennessee Univ., Knoxville, TN, USA
  • Volume
    26
  • Issue
    1
  • fYear
    1991
  • fDate
    2/1/1991 12:00:00 AM
  • Firstpage
    171
  • Lastpage
    177
  • Abstract
    The electrically ruptured areas of failed crosslinked polyethylenes have been investigated using optical microscopy and Fourier transform infrared spectroscopy (FTIR). The formation of well-defined banded spherulites was observed around the ruptured areas. Since spherulites do not occur in crosslinked polyethylenes, the formation of spherulites in failed specimens is considered to be related to breakage of the network during the breakdown process. FTIR results are shown to support this suggestion, revealing that more than oxidation occurred during the breakdown process. This observation contradicts some well-established breakdown mechanisms, such as thermal breakdown. It is also shown that, if the initiation of electrical breakdown involves network rupture, the properties of crosslinked polyethylene could be enhanced by designing less reactive crosslink points
  • Keywords
    electric breakdown of solids; failure analysis; infrared spectroscopy; materials testing; optical microscopy; organic insulating materials; polymers; FTIR; Fourier transform infrared spectroscopy; XLPE; breakdown mechanisms; breakdown process; crosslinked polyethylene; designing less reactive crosslink points; electrically ruptured area; failed specimens; initiation of electrical breakdown; network rupture; optical microscopy; well-defined banded spherulites; Crystallization; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Helium; Optical microscopy; Polyethylene; Polymers; Solids; Trees - insulation;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/14.68237
  • Filename
    68237