DocumentCode :
1389626
Title :
Gas avalanche pixel detectors with amorphous silicon carbide (a-Si:C:H) overcoating
Author :
Hong, W.S. ; Cho, H.S. ; Biagi, S. ; Retiere, F. ; Kadyk, J. ; Perez-Mendez, V. ; Palaio, N. ; Vujic, J.
Author_Institution :
Div. of Phys., Lawrence Berkeley Lab., CA, USA
Volume :
45
Issue :
3
fYear :
1998
fDate :
6/1/1998 12:00:00 AM
Firstpage :
252
Lastpage :
257
Abstract :
The performance of gas avalanche pixel detectors of square and circular geometry, with and without semiconducting surface coating, was characterized in terms of gas gain and active region. Although the electric field profile of the square geometry cannot be radially uniform, a 200 μm pitch detector of this type exhibited a maximum gain of ~12000 which is comparable to that of the circular counterpart. Due to the existence of the anode bus lines passing under the cathodes, there is a defocusing effect of the drift field lines converging to the anodes, resulting in inactive regions where electrons produced from gas ionization are not collected at the anodes. Variation of the count rate with the drift field was measured to probe these defocusing effects. The p-type a-Si:C:H surface coating was effective in reducing these inactive regions
Keywords :
silicon radiation detectors; Si:C,H; a-Si:C:H; active region; anode bus lines; circular; count rate; defocusing; drift field lines; electric field profile; gas avalanche pixel detectors; gas gain; p-type; square; Amorphous silicon; Anodes; Cathodes; Coatings; Detectors; Electrons; Geometry; Ionization; Performance gain; Semiconductivity;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.682389
Filename :
682389
Link To Document :
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