Limitations of a relaxation oscillator in capacitance measurements

Author

Liu, Yili ; Chen, Song ; Nakayama, Masakatsu ; Watanabe, Kenzo

Author_Institution

Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan

Volume

49

Issue

5

fYear

2000

fDate

10/1/2000 12:00:00 AM

Firstpage

980

Lastpage

983

Abstract

Oscillation periods of a relaxation oscillator consisting of an op-amp-based integrator and a comparator are measured over a wide range of RC integration constants, and the results are compared with theoretical values derived in terms of the finite gain-bandwidth (GB) product and the slew rate of an op-amp and the response delay of a comparator. The comparison validates the theoretical derivation which gives the design criteria of a relaxation oscillator for capacitance measurements and sensor signal processing

Keywords

capacitance measurement; comparators (circuits); measurement errors; operational amplifiers; relaxation oscillators; signal processing; RC integration constants; capacitance measurements; comparator; finite gain-bandwidth product; integrator; operational amplifier; relaxation oscillator; response delay; sensor signal processing; slew rate; Capacitance measurement; Circuits; Electrical resistance measurement; Gain measurement; Operational amplifiers; Oscillators; Performance analysis; Signal processing; Transducers; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.872917

Filename

872917