Title :
Quantitative magnetometry using electron holography: field profiles near magnetic force microscope tips
Author :
Streblechenko, Dmitry G. ; Scheinfein, M.R. ; Mankos, Marian ; Babcock, Ken
Author_Institution :
Dept. of Phys., Arizona State Univ., Tempe, AZ, USA
fDate :
9/1/1996 12:00:00 AM
Abstract :
Magnetic force microscopy offers an inexpensive means of measuring magnetic microstructure with high spatial resolution by scanning a magnetized tip across the surface of a magnetic sample. Contrast in the magnetic force microscope is a complicated function of the magnetic fields emanating both from the tip and the sample under observation. Electron holographic methods were used in order to quantitatively determine the fields in proximity to extremely small magnetic force microscope tips
Keywords :
electron optics; holography; image reconstruction; image resolution; magnetic field measurement; magnetic force microscopy; magnetometers; scanning-transmission electron microscopy; contrast; electron holography; extremely small magnetic force microscope tips; far-out-of-focus STEM electron holography; field profile measurement; high spatial resolution; magnetic force microscopy; magnetic microstructure; magnetic sample surface scanning; magnetized tip; quantitative magnetometry; reconstructed phase; Electron beams; Electron microscopy; Holography; Magnetic analysis; Magnetic force microscopy; Magnetic forces; Magnetic separation; Magnetostatic waves; Micromagnetics; Scanning electron microscopy;
Journal_Title :
Magnetics, IEEE Transactions on
