Title :
Toward Holistic Scene Understanding: Feedback Enabled Cascaded Classification Models
Author :
Li, Congcong ; Kowdle, Adarsh ; Saxena, Ashutosh ; Chen, Tsuhan
Author_Institution :
Dept. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
fDate :
7/1/2012 12:00:00 AM
Abstract :
Scene understanding includes many related subtasks, such as scene categorization, depth estimation, object detection, etc. Each of these subtasks is often notoriously hard, and state-of-the-art classifiers already exist for many of them. These classifiers operate on the same raw image and provide correlated outputs. It is desirable to have an algorithm that can capture such correlation without requiring any changes to the inner workings of any classifier. We propose Feedback Enabled Cascaded Classification Models (FE-CCM), that jointly optimizes all the subtasks while requiring only a “black box” interface to the original classifier for each subtask. We use a two-layer cascade of classifiers, which are repeated instantiations of the original ones, with the output of the first layer fed into the second layer as input. Our training method involves a feedback step that allows later classifiers to provide earlier classifiers information about which error modes to focus on. We show that our method significantly improves performance in all the subtasks in the domain of scene understanding, where we consider depth estimation, scene categorization, event categorization, object detection, geometric labeling, and saliency detection. Our method also improves performance in two robotic applications: an object-grasping robot and an object-finding robot.
Keywords :
image classification; robot vision; FE-CCM; black box interface; correlated outputs; depth estimation; event categorization; feedback enabled cascaded classification models; geometric labeling; holistic scene understanding; object detection; saliency detection; scene categorization; scene understanding; Equations; Estimation; Inference algorithms; Mathematical model; Object detection; Robots; Training; Scene understanding; classification; machine learning; robotics.;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2011.232