• DocumentCode
    1390058
  • Title

    High-Performance Oxide Thin-Film Transistors Using a Volatile Nitrate Precursor for Low-Temperature Solution Process

  • Author

    Jeong, Woong Hee ; Bae, Jung Hyeon ; Kim, Hyun Jae

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
  • Volume
    33
  • Issue
    1
  • fYear
    2012
  • Firstpage
    68
  • Lastpage
    70
  • Abstract
    Solution-processed InZnO (IZO) thin-film transistors (TFTs) are fabricated using a volatile metal nitrate precursor (Np) with annealing at 300°C. Because the metal Np decomposes at low temperatures, metal oxide bonds were formed, and the organic residue in the oxide thin films was evaporated at low temperature. At 300°C , the IZO thin films with Zn Np were of higher quality than those with Zn acetate precursor due to the reduced atomic disorder and evaporation of residual organics. The mobility of the IZO TFTs with Zn Np was 1.92 cm2/V·s at 300°C annealing.
  • Keywords
    II-VI semiconductors; annealing; indium compounds; thin film transistors; vacuum deposition; zinc compounds; InZnO; acetate precursor; annealing; atomic disorder; evaporation; low-temperature solution process; metal oxide bonds; organic residue; oxide thin-film transistors; temperature 300 degC; volatile metal nitrate precursor; volatile nitrate precursor; Annealing; Temperature; Thin film transistors; X-ray scattering; Zinc; Indium zinc oxide; low temperature; nitrate precursor (Np); solution process; thin-film transistor (TFT);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2011.2173897
  • Filename
    6095583