DocumentCode :
139006
Title :
Multi-class ERP-based BCI data analysis using a discriminant space self-organizing map
Author :
Onishi, Akinari ; Natsume, K.
Author_Institution :
Dept. of Brain Sci. & Eng., Kyushu Inst. of Technol., Kitakyushu, Japan
fYear :
2014
fDate :
26-30 Aug. 2014
Firstpage :
26
Lastpage :
29
Abstract :
Emotional or non-emotional image stimulus is recently applied to event-related potential (ERP) based brain computer interfaces (BCI). Though the classification performance is over 80% in a single trial, a discrimination between those ERPs has not been considered. In this research we tried to clarify the discriminability of four-class ERP-based BCI target data elicited by desk, seal, spider images and letter intensifications. A conventional self organizing map (SOM) and newly proposed discriminant space SOM (ds-SOM) were applied, then the discriminabilites were visualized. We also classify all pairs of those ERPs by stepwise linear discriminant analysis (SWLDA) and verify the visualization of discriminabilities. As a result, the ds-SOM showed understandable visualization of the data with a shorter computational time than the traditional SOM. We also confirmed the clear boundary between the letter cluster and the other clusters. The result was coherent with the classification performances by SWLDA. The method might be helpful not only for developing a new BCI paradigm, but also for the big data analysis.
Keywords :
brain-computer interfaces; medical computing; self-organising feature maps; BCI data analysis; ERP-based BCI target data; SWLDA; big data analysis; discriminant space SOM; discriminant space self-organizing map; event-related potential; letter intensifications; multiclass ERP; self organizing map; spider images; stepwise linear discriminant analysis; Accuracy; Brain-computer interfaces; Data visualization; Nickel; Organizing; Seals; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
ISSN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2014.6943520
Filename :
6943520
Link To Document :
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