DocumentCode :
1390172
Title :
Estimation of the Effects of Microscopic Misalignments on the Magnetization Process in Thin Films by Energetic Modeling
Author :
Haumer, Peter ; Fulmek, Paul L.
Author_Institution :
Inst. of Sensor & Actuator Syst., Vienna Univ. of Technol., Vienna, Austria
Volume :
46
Issue :
2
fYear :
2010
Firstpage :
247
Lastpage :
250
Abstract :
In the framework of an energetic model, which is based on a stochastic description of the macroscopic magnetization process, we want to explain how misalignments of microscopic magnetic dipoles influence the magnetization curve. In contrast to previous work, the orientation of the elementary magnetic dipoles is modeled via statistical distribution functions that are characterized by a mean orientation and a corresponding variance that accounts for misalignments. This nonuniform orientation can result from structural defects in the crystal lattice, for example. The model is applied to thin-film permalloy samples that are used in anisotropic magnetoresistive sensor elements. Here, the variance of the angular distribution function is a measure for inhomogeneities in the film. Furthermore, it can be shown how technological parameters of the sputter process influence the alignment of the magnetic moments and, thus, determine the magnetoresistive characteristics of the sensor element.
Keywords :
Permalloy; crystal defects; magnetic moments; magnetisation; magnetostriction; metallic thin films; sputter deposition; statistical distributions; stochastic processes; FeNiJk; angular distribution function; anisotropic magnetoresistive sensor elements; crystal lattice; energetic modeling; inhomogeneity; macroscopic magnetization process; magnetic moments; magnetization curve; magnetoresistive characteristics; mean orientation; microscopic magnetic dipoles; microscopic misalignments; nonuniform orientation; sensor element; sputter process; statistical distribution functions; stochastic description; structural defects; thin-film permalloy; Anisotropic magnetoresistance; Magnetic anisotropy; Magnetic force microscopy; Magnetic sensors; Magnetization processes; Perpendicular magnetic anisotropy; Sensor phenomena and characterization; Statistical distributions; Stochastic processes; Transistors; Anisotropic media; magnetic films; magnetic hysteresis; magnetization process;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2009.2033459
Filename :
5393200
Link To Document :
بازگشت