DocumentCode :
1390265
Title :
Germanium orthogonal strip detectors with amorphous-semiconductor contacts
Author :
Luke, P.N. ; Amman, M. ; Phlips, B.F. ; Johnson, W.N. ; Kroege, R.A.
Author_Institution :
Lawrence Berkeley Nat. Lab., California Univ., Berkeley, CA, USA
Volume :
47
Issue :
4
fYear :
2000
fDate :
8/1/2000 12:00:00 AM
Firstpage :
1360
Lastpage :
1363
Abstract :
Germanium orthogonal strip detectors have been produced using amorphous-semiconductor contacts. The amorphous-semiconductor contact fabrication process is relatively simple, and it is capable of producing fine-pitched electrode structures. The bipolar blocking behavior of the amorphous-semiconductor contact permits its use on both sides of a detector, replacing conventional B ion implanted and Li diffused contacts. A 5×5 orthogonal strip detector has been produced using this technique. Experimental results from this detector are presented
Keywords :
amorphous semiconductors; germanium radiation detectors; Ge; Ge orthogonal strip detectors; amorphous-semiconductor contact fabrication process; amorphous-semiconductor contacts; bipolar blocking behavior; fine-pitched electrode structures; Amorphous materials; Contacts; Detectors; Electrodes; Energy resolution; Fabrication; Germanium; Laboratories; Spatial resolution; Strips;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.872978
Filename :
872978
Link To Document :
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