DocumentCode :
1390283
Title :
Probe station testing of large area silicon drift detectors
Author :
Asmus, A. ; Bellwied, R. ; Beuttenmuller, R. ; Chen, W. ; Dyke, H. ; Eremin, V. ; Fiske, D.R. ; Hoffmann, G.W. ; Humanic, T.J. ; Grau, M. ; Ilyashenko, I. ; Kotov, I.V. ; Kraner, H.W. ; Leonhardt, B. ; Li, Z. ; Lynn, D. ; Pandey, S.U. ; Schambach, J. ; Se
Author_Institution :
STAR-SVT Collaboration, Brookhaven Nat. Lab., Upton, NY, USA
Volume :
47
Issue :
4
fYear :
2000
fDate :
8/1/2000 12:00:00 AM
Firstpage :
1375
Lastpage :
1380
Abstract :
Probe stations for STAR Si drift detectors testing were developed and built at BNT and Ohio State University. A throughput of a wafer per day per probe station was reached. The testing procedure and probe station design criteria are discussed
Keywords :
silicon radiation detectors; Si; Si drift detector; large area Si drift detectors; probe station; testing procedure; Anodes; Cathodes; Detectors; Electrodes; Electrons; Probes; Silicon; Strips; Testing; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.872981
Filename :
872981
Link To Document :
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