Title :
Quantitative micromagnetics: electron holography of magnetic thin films and multilayers
Author :
Mankos, Marian ; Scheinfein, M.R. ; Cowley, J.M.
Author_Institution :
Dept. of Phys. & Astron., Arizona State Univ., Tempe, AZ, USA
fDate :
9/1/1996 12:00:00 AM
Abstract :
A new method for the absolute measurement of magnetic microstructure at nanometer spatial resolution in magnetic materials has been developed by implementing off-axis electron holography in a scanning transmission electron microscope (STEM). The holography modes permit quantitative measurement of magnetic induction and magnetization, the determination of equimagnetization lines in domains and straightforward determination of domain wall and flux vortex profiles. STEM holography accompanied by the conventional techniques has been applied to the characterisation of thin magnetic films, magnetic multilayer structures and small magnetic particles. This combination of micromagnetic analysis techniques in one instrument provides a valuable tool for the investigation of magnetic microstructure and microscopic structure in magnetic materials with high sensitivity (~10-15 emu) and at nm spatial resolution
Keywords :
holography; magnetic domains; magnetic multilayers; magnetic thin films; scanning-transmission electron microscopy; domain wall; electron holography; flux vortex; magnetic induction; magnetic material; magnetic microstructure; magnetic multilayer; magnetic particle; magnetic thin film; magnetization; micromagnetic analysis; nanometer spatial resolution; quantitative measurement; scanning transmission electron microscopy; Holography; Magnetic domain walls; Magnetic domains; Magnetic flux; Magnetic force microscopy; Magnetic materials; Micromagnetics; Scanning electron microscopy; Spatial resolution; Transmission electron microscopy;
Journal_Title :
Magnetics, IEEE Transactions on
