Title :
High resolution CdZnTe pixel detectors with VLSI readout
Author :
Cook, Walter R. ; Boggs, Steven E. ; Bolotnikov, Aleksey E. ; Burnham, Jill A. ; Fitzsimmons, Michael J. ; Harrison, Fiona A. ; Kecman, Branislav ; Matthews, Brian ; Schindler, Stephen M.
Author_Institution :
California Inst. of Technol., Pasadena, CA, USA
fDate :
8/1/2000 12:00:00 AM
Abstract :
CdZnTe pixel detectors with a custom VLSI readout, are being developed at Caltech/JPL for use in focusing hard X-ray telescopes. We have recently tested several prototype detector assemblies, each consisting of a 2 mm thick CdZnTe pixel detector indium bump bonded to our VLSI readout chip. A complete pulse height analysis chain is located directly below each 680 by 650 μm pixel and includes a preamplifier, shaping amplifiers, and a peak stretcher/discriminator. Here we report on the first fully functional operation of these detector/VLSI hybrids. Using an 241Am source, collimated to illuminate a single pixel, excellent energy resolution of 670 eV FWHM was measured for the 59.5 keV line at -10 C, with electronic noise of only 340 eV FWHM. Illumination with an uncollimated 241Am source was performed to assess the uniformity of pixel response and to exercise the readout chip´s ability to process multiple pixel events arising from X-rays interacting above pixel boundaries. The imaging capability of the detector was demonstrated using a tungsten slit mask
Keywords :
VLSI; discriminators; nuclear electronics; preamplifiers; pulse shaping circuits; semiconductor counters; 2 mm; 59.5 keV; 241Am source; CdZnTe; CdZnTe pixel detector; VLSI readout; discriminator; electronic noise; energy resolution; focusing hard X-ray telescope; pixel response; preamplifier; shaping amplifier; Assembly; Focusing; Indium; Prototypes; Pulse amplifiers; Telescopes; Testing; Very large scale integration; X-ray detection; X-ray detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on