Title :
Increasing yield and reliability through postsilicon tuning
Abstract :
This issue of D&T features six articles on postsilicon calibration and repair. The articles span both design and test aspects of chip and system design, and highlight the interplay between design and test solutions.
Keywords :
calibration and repair; design and test; low-power; mixed-signal; parameter variation; postsilicon tuning; process variation; yield and reliability;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2010.135
