• DocumentCode
    1390938
  • Title

    Guest Editors´ Introduction: Managing Uncertainty through Postfabrication Calibration and Repair

  • Author

    Bhunia, Swarup ; Rao, Rahul

  • Author_Institution
    Case Western Reserve University
  • Volume
    27
  • Issue
    6
  • fYear
    2010
  • Firstpage
    4
  • Lastpage
    5
  • Abstract
    This special issue presents six articles that highlight challenges, and approaches toward improving, design yield and reliability through postsilicon optimizations. The articles cover postsilicon adaptation and repair issues in a wide range of areas including analog circuits, embedded memories, and multicore systems.
  • Keywords
    Built-in self-test; Calibration; Special issues and sections; Uncertainty; built-in self-repair; calibration; design and test; many-core; multicore; postsilicon optimization; reliability; self-repair; thermal management; yield improvement;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2010.134
  • Filename
    5648490
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1390938