• DocumentCode
    1390952
  • Title

    Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies

  • Author

    Chen, Wu-Hsin ; Jung, Byunghoo

  • Volume
    27
  • Issue
    6
  • fYear
    2010
  • Firstpage
    18
  • Lastpage
    25
  • Abstract
    Despite their inherent self-healing nature, noise (jitter) in phase-locked loops is sensitive to process and environmental variation. This article discusses automatic frequency calibration and amplitude control techniques that rely on a negative feedback loop with a large emphasis on digitally assisted calibration.
  • Keywords
    CMOS integrated circuits; calibration; phase locked loops; PLL; amplitude control techniques; automatic frequency calibration; deep-scaled CMOS technologies; digitally assisted calibration; negative feedback loop; self-healing phase-locked loops; Calibration; Detectors; Frequency control; Noise; Phase locked loops; Voltage-controlled oscillators; automatic amplitude control; design and test; digital-feedback control; noise control; phase-locked loop; self-healing; yield improvement;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2010.138
  • Filename
    5648492
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1390952