DocumentCode
1390985
Title
About the power problem [review of "Power-Aware Testing and Test Strategies for Low Power Devices" (Girard, P., Eds., et.; 2010)]
Author
Davidson, S.
Volume
27
Issue
6
fYear
2010
Firstpage
72
Lastpage
73
Abstract
This is a review of Power-Aware Testing and Test Strategies for Low Power Devices (Patrick Girard, Nicola Nicolici, and Xiapqing Wen, eds.).
Keywords
Book reviews; Low power electronics; Testing; design and test; literature survey; low power; power-aware testing; test strategies;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2010.122
Filename
5648497
Link To Document