• DocumentCode
    1391262
  • Title

    Short-Time Fourier Transform of Deeply Located Tunnel Signatures Measured by Cross-Borehole Pulse Radar

  • Author

    Kim, Sang-Wook ; Kim, Se-Yun ; Nam, Sangwook

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
  • Volume
    8
  • Issue
    3
  • fYear
    2011
  • fDate
    5/1/2011 12:00:00 AM
  • Firstpage
    493
  • Lastpage
    496
  • Abstract
    The pulse signatures of a deeply located dormant tunnel are measured by operating cross-borehole short-pulse radar in a well-suited tunnel test site in Korea. The relatively fast arrival of the first peak at depth of the empty tunnel, as indicated by data analysis, may play a key role in detecting the tunnel´s precise location. Following short-time Fourier transform (STFT) of the data, the arrival time of the first peak is shown to be faster and more distinctive than that without STFTThe pulse signatures of a deeply located dormant tunnel are measured by operating cross-borehole short-pulse radar in a well-suited tunnel test site in Korea. The relatively fast arrival of the first peak at depth of the empty tunnel, as indicated by data analysis, may play a key role in detecting the tunnel´s precise location. Following short-time Fourier transform (STFT) of the data, the arrival time of the first peak is shown to be faster and more distinctive than that without STFT if the observation frequency is properly selected. if the observation frequency is properly selected.
  • Keywords
    Fourier transforms; data analysis; geophysical prospecting; tunnels; Korea; cross-borehole pulse radar; data analysis; deeply pulse located dormant tunnel; short-time Fourier transform; tunnel test site; Attenuation; Data mining; Fourier transforms; Pulse measurements; Radar measurements; Time domain analysis; Air cavity; cross-hole radar; pulse radar; short-time Fourier transform (STFT); underground tunnel;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2010.2089039
  • Filename
    5648727