DocumentCode
1391491
Title
Signal integrity
Author
Fan, Jintao
Volume
1
Issue
4
fYear
2012
Firstpage
75
Lastpage
75
Abstract
Welcome to the Signal Integrity Column! In this issue, Dr. Xiaoning Ye from Intel Corporation presents interesting error analysis with examples for de-embedding, a commonly used technique for removing the unwanted effects of test fixtures in vector network analyzer measurements.
fLanguage
English
Journal_Title
Electromagnetic Compatibility Magazine, IEEE
Publisher
ieee
ISSN
2162-2264
Type
jour
DOI
10.1109/MEMC.2012.6397063
Filename
6397063
Link To Document