• DocumentCode
    1391700
  • Title

    Design methodology for mitigating transient errors in analogue and mixed-signal circuits

  • Author

    Askari, Sina ; Nourani, M.

  • Author_Institution
    Center for Integrated Circuits & Syst., Univ. of Texas at Dallas, Richardson, TX, USA
  • Volume
    6
  • Issue
    6
  • fYear
    2012
  • Firstpage
    447
  • Lastpage
    456
  • Abstract
    N-tuple modular redundancy techniques have been widely used to improve the reliability of digital circuits. Unfortunately, an equivalent technique has been rarely used for analogue and mixed-signal systems. In this study, propose a redundancy-based fault-tolerant methodology is proposed to design highly reliable analogue and mixed-signal circuits. The key contribution of the proposed work is: (a) systematic sensitivity analysis to identify critical nodes in a circuit and (b) a design methodology for improving the reliability of analogue and mixed-signal circuits using an innovative mean voter. The mean voter is a low-power, small area, very high bandwidth and linearly scalable unit; and it works for both odd and even redundancy factors. For the proof of concept, the authors designed two analogue-to-digital converters and an analogue filter, which are used in mixed-signal applications. Experimental results are reported to verify the concept and measure the system´s reliability when failures, such as single upset transient faults, occur.
  • Keywords
    analogue circuits; analogue-digital conversion; integrated circuit design; integrated circuit reliability; mixed analogue-digital integrated circuits; redundancy; N-tuple modular redundancy techniques; analogue circuits; analogue filter; analogue systems; analogue-to-digital converters; critical nodes; design methodology; digital circuits; equivalent technique; linearly scalable unit; mean voter; mixed-signal applications; mixed-signal circuits; mixed-signal systems; redundancy factors; redundancy-based fault-tolerant methodology; single upset transient faults; systematic sensitivity analysis; transient errors;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices & Systems, IET
  • Publisher
    iet
  • ISSN
    1751-858X
  • Type

    jour

  • DOI
    10.1049/iet-cds.2012.0053
  • Filename
    6397099