• DocumentCode
    1391789
  • Title

    Determination of simple equivalent circuits of interacting discontinuities in waveguides or transmission lines

  • Author

    Levy, Ralph

  • Author_Institution
    Levy Associates, La Jolla, CA, USA
  • Volume
    48
  • Issue
    10
  • fYear
    2000
  • fDate
    10/1/2000 12:00:00 AM
  • Firstpage
    1712
  • Lastpage
    1716
  • Abstract
    It is well known that the generalized scattering matrix (GSM) of a microwave network, which includes one or more ports supporting evanescent modes, is nonunitary. This has hindered the formation of equivalent circuits since it has not been evident how to form the impedance or admittance matrix. This paper describes how the problem has been overcome, resulting in a method for the formation of simple equivalent circuits of interacting closely spaced discontinuities in a waveguide. The n-port immittance matrix corresponding to the nonunitary GSM is formed by normalizing the imittance matrix to real or imaginary portal impedances. As an example, an equivalent circuit for the even mode of a waveguide short-slot coupler is presented, and the effect of the evanescent TE30 mode in the coupling region is clearly expressed by an evanescent-mode waveguide in parallel with one supporting the dominant propagating mode. The method should find wide applications to problems involving interactions in waveguides
  • Keywords
    S-matrix theory; equivalent circuits; waveguide couplers; waveguide discontinuities; waveguide theory; TE30 mode; closely spaced discontinuities; dominant propagating mode; equivalent circuits; evanescent modes; generalized scattering matrix; interacting discontinuities; n-port immittance matrix; portal impedances; waveguide short-slot coupler; Admittance; Coupling circuits; Equivalent circuits; GSM; Impedance; Portals; Scattering; Tellurium; Transmission line matrix methods; Waveguide discontinuities;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.873900
  • Filename
    873900