• DocumentCode
    1391802
  • Title

    Extending scattering-parameter approach to characterization of linear time-varying microwave devices

  • Author

    Green, Kenton ; Sobolewski, Roman

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA
  • Volume
    48
  • Issue
    10
  • fYear
    2000
  • fDate
    10/1/2000 12:00:00 AM
  • Firstpage
    1725
  • Lastpage
    1731
  • Abstract
    In this paper, we apply the theory of linear time-varying differential systems of equations to defining an extension of the standard scattering parameters. This extended parameter S˜ (ω, t) is a function of both time and frequency. With this definition, we can accurately characterize rapidly time and frequency-varying linear lumped causal microwave devices, in particular, photoconductive microwave switches. We discuss the similarities between S˜ (ω,t) and the standard S-parameter approach and describe a measurement technique. We also derive some important properties of the S˜ (ω,t)-parameters and describe conditions under which microwave devices such as photoconductive switches can be analyzed by this technique. To demonstrate the usefulness of S˜ (ω, t), we derive the complete transfer function of the time varying lumped-element model of a photoconductive switch. We also show the limitations of conventional time-invariant assumptions (based on windowing or apodization) to accurately model linear time-varying devices
  • Keywords
    S-matrix theory; S-parameters; differential equations; frequency response; microwave photonics; microwave switches; photoconducting switches; transfer functions; transient response; linear microwave devices; linear time-varying differential systems of equations; lumped causal microwave devices; measurement technique; microwave device characterization; photoconductive microwave switches; scattering-parameter approach; standard scattering parameters; time varying lumped-element model; time-varying microwave devices; transfer function; Differential equations; Frequency; Measurement standards; Measurement techniques; Microwave devices; Microwave theory and techniques; Photoconducting devices; Scattering parameters; Switches; Time varying systems;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.873902
  • Filename
    873902