• DocumentCode
    1391923
  • Title

    REBULF super junction MOSFET with N+ buried layer

  • Author

    Baoxing Duan ; Yintang Yang

  • Author_Institution
    Key Lab. of the Minist. of Educ. for Wide Band-Gap Semicond. Mater. & Devices, Xidian Univ., Xi´an, China
  • Volume
    6
  • Issue
    11
  • fYear
    2011
  • Firstpage
    881
  • Lastpage
    883
  • Abstract
    A reduced bulk field (REBULF) super junction metal-oxide semiconductor field-effect transistor is designed for the first time with N+ buried layer in the P-type high resistance substrate. The substrate-assisted depletion effect, resulting from charge imbalance between the N and P-type pillars when the super junction is implemented on the P-type substrate, is suppressed due to the charge compensation by the N+ buried layer. The high electric field around the drain is reduced, thanks to the REBULF effect which causes the redistribution of the electric field in the drift region; thus the breakdown voltage is improved because the substrate supports more biases. The new structure features high breakdown voltage, low specific on-resistance and charge balance in drift region.
  • Keywords
    MOSFET; charge compensation; electric breakdown; REBULF super junction MOSFET; breakdown voltage; buried layer; charge balance; charge compensation; charge imbalance; drift region; n-type pillar; p-type high resistance substrate; p-type pillar; reduced-bulk field super junction metal-oxide semiconductor field-effect transistor; substrate-assisted depletion effect;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2011.0426
  • Filename
    6096494