Title :
Kuijk Bandgap Voltage Reference With High Immunity to EMI
Author :
Redouté, Jean-Michel ; Steyaert, Michiel
Author_Institution :
Dept. of Electr. Eng. (ESAT), Katholieke Univ. Leuven, Leuven, Belgium
Abstract :
This brief evaluates the effect of conducted electromagnetic interference (EMI) that is injected in the power supply of a classic Kuijk bandgap reference voltage circuit. Two modified Kuijk bandgap topologies with high immunity to EMI are introduced and compared to the original structure. Measurements of a test IC confirm the theoretical analyses.
Keywords :
electromagnetic interference; integrated circuit testing; reference circuits; EMI; Kuijk bandgap voltage reference; electromagnetic interference; high immunity; integrated circuit testing; power supply; Bandgap voltage references; electromagnetic compatibility; electromagnetic interference;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2009.2037991
