DocumentCode :
1393217
Title :
Image Enhancement in Transient Lock-In Thermography Through Time Series Reconstruction and Spatial Slope Correction
Author :
Chatterjee, Krishnendu ; Tuli, Suneet
Author_Institution :
Centre for Appl. Res. in Electron., Indian Inst. of Technol., Delhi, India
Volume :
61
Issue :
4
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
1079
Lastpage :
1089
Abstract :
Lock-in (LI) thermography is a popular thermal-nondestructive-testing technique which, like other active thermographic techniques, requires an external heating stimulus, preferably on a blackened surface. It is not, however, immune to nonideal situations like nonuniform heating and surface emissivity variation. The phase image, to some extent, helps to reduce the effect of these artifacts but is inadequate if the variations are large. For example, a poorly blackened metallic sample with reflecting patches on its surface is very difficult to actively thermograph because of direct reflection from the surface. This paper proposes an image reconstruction algorithm for offline removal of such artifacts. In addition, the proposed algorithm enables LI thermography tests in the transient regime and removes temperature gradients due to nonuniform heating. The algorithm was tested with a mild-steel sample having 20-mm-diameter back-drilled holes at various depths ranging from 0.2 to 7.7 mm, stimulated at 20-, 40-, 50-, 60-, and 80-mHz excitation frequencies. The effect of the total number of heating cycles is also presented.
Keywords :
carbon steel; image enhancement; image reconstruction; infrared imaging; materials science computing; nondestructive testing; time series; back-drilled holes; frequency 20 mHz to 80 mHz; heating cycles; image enhancement; mild-steel sample; nonuniform heating; offline artifact removal; size 0.2 mm to 7.7 mm; size 20 mm; spatial slope correction; temperature gradient removal; thermal nondestructive testing technique; time series reconstruction; transient lock-in thermography; Heating; Image reconstruction; Materials; Polynomials; Surface fitting; Surface reconstruction; Transient analysis; Lock-in thermography; nonuniform heating; spatial slope correction; surface emissivity variation; time series reconstruction;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2011.2174095
Filename :
6097056
Link To Document :
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