DocumentCode
1393931
Title
High-performance low-power sensing scheme for nanoscale SRAMs
Author
Valaee, A. ; Al-Khalili, A.J.
Author_Institution
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
Volume
6
Issue
6
fYear
2012
fDate
11/1/2012 12:00:00 AM
Firstpage
406
Lastpage
413
Abstract
SRAMs in nanoscale CMOS technology suffer from plethora of design challenges such as increased process variation, increased leakage current and variation in the cell current that threatens the reliability of sensing scheme. These issues coupled with continuous increase in the SRAMs size, requires additional techniques and treatments such as read-assist techniques to ensure fast and reliable read operation. In this study, the authors address these concerns and propose a novel read-assist sensing scheme. The circuit is simulated using Spectre in 65 nm CMOS technology. Simulation results showed an increased sensing speed, lower power dissipation and enhanced SRAM dynamic cell stability. A complete comparison is made between the proposed scheme, the conventional circuit and another state of the art design, which shows speed improvement of 55.34, 66.01 and power reduction of 21.33, 89.09 with respect to conventional sense amplifier and the referenced scheme, respectively. These enhancements are at the expense of negligible area overhead. Also, the proposed scheme enables one to reduce the cell s VDD by 227 and 345 mV for the same operating frequency with respect to conventional and referenced circuits, respectively. This results in leakage power reduction of 19.7 and 30 which constitutes a considerable portion of overall power dissipation in nanoscale SRAMs.
Keywords
CMOS memory circuits; SRAM chips; amplifiers; integrated circuit reliability; low-power electronics; nanoelectronics; Spectre; cell current; enhanced SRAM dynamic cell stability; high-performance low-power sensing reliability scheme; increased leakage current; leakage power reduction; nanoscale CMOS technology; nanoscale SRAM; power reduction; read-assist techniques; sense amplifier; size 65 nm;
fLanguage
English
Journal_Title
Computers & Digital Techniques, IET
Publisher
iet
ISSN
1751-8601
Type
jour
DOI
10.1049/iet-cdt.2012.0038
Filename
6403644
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