Title :
Combining Results of Accelerated Radiation Tests and Fault Injections to Predict the Error Rate of an Application Implemented in SRAM-Based FPGAs
Author :
Velazco, Raoul ; Foucard, Gilles ; Peronnard, Paul
Author_Institution :
Lab. Tech. de l´´lnformatique et de la Microelectron. pour l´´Archit. des Syst. integres (TIMA), Grenoble, France
Abstract :
An approach combining the SRAM-based field-programmable gate array static cross-section with the results of fault injection campaigns allows predicting the error rate of any implemented application. Experimental results issued from heavy ion tests are compared with predictions to validate the proposed methodology.
Keywords :
SRAM chips; field programmable gate arrays; SRAM-Based FPGA; accelerated radiation tests; error rate; fault injection campaigns; field-programmable gate arrays; heavy ion tests; static cross-section; Fault tolerance; Field programmable gate arrays; Life estimation; Single event upset; Accelerated testing; fault injection; fault tolerance; field-programmable gate arrays (FPGAs); single-event rates; single-event upsets SEUs); space applications;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2087355
