DocumentCode :
1394466
Title :
SEE Characterization of the New RTAX-DSP (RTAX-D) Antifuse-Based FPGA
Author :
Rezgui, Sana ; Louris, Paul ; Sharmin, Rezwana
Author_Institution :
Actel Corp., Mountain View, CA, USA
Volume :
57
Issue :
6
fYear :
2010
Firstpage :
3537
Lastpage :
3546
Abstract :
A comprehensive SEE characterization at high-frequencies (up to 120 MHz) of the new space-flight RTAX-D antifuse-based FPGA family is presented. SEE hardening-by-design techniques in the main FPGA programmable architectures have been implemented. It is evaluated in-beam to show their efficacy in mitigating SETs with little area and time penalty. In particular, SEU/SET mitigation solutions were implemented in the new embedded DSP blocks and the FPGA core and tested in heavy-ion beams. Comparing to its predecessor, RTAX-S, these mitigations reduce the overall orbital error-rates by an order of magnitude.
Keywords :
field programmable gate arrays; ion beam effects; radiation hardening (electronics); SEU-SET mitigation solutions; antifuse-based FPGA family; comprehensive SEE characterization; hardening-by-design techniques; heavy-ion beams; main FPGA programmable architectures; orbital error-rates; single event upsets; space-flight RTAX-D; space-flight field programmable gate array; Digital signal processing; Field programmable gate arrays; Radiation hardening; Antifuse-based FPGAs; DSPs; SET characterization and mitigation; hardening-by-design; heavy-ions; non-volatile FPGAs; radiation tests;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2010.2085017
Filename :
5658012
Link To Document :
بازگشت