Title :
SEE Characterization of the New RTAX-DSP (RTAX-D) Antifuse-Based FPGA
Author :
Rezgui, Sana ; Louris, Paul ; Sharmin, Rezwana
Author_Institution :
Actel Corp., Mountain View, CA, USA
Abstract :
A comprehensive SEE characterization at high-frequencies (up to 120 MHz) of the new space-flight RTAX-D antifuse-based FPGA family is presented. SEE hardening-by-design techniques in the main FPGA programmable architectures have been implemented. It is evaluated in-beam to show their efficacy in mitigating SETs with little area and time penalty. In particular, SEU/SET mitigation solutions were implemented in the new embedded DSP blocks and the FPGA core and tested in heavy-ion beams. Comparing to its predecessor, RTAX-S, these mitigations reduce the overall orbital error-rates by an order of magnitude.
Keywords :
field programmable gate arrays; ion beam effects; radiation hardening (electronics); SEU-SET mitigation solutions; antifuse-based FPGA family; comprehensive SEE characterization; hardening-by-design techniques; heavy-ion beams; main FPGA programmable architectures; orbital error-rates; single event upsets; space-flight RTAX-D; space-flight field programmable gate array; Digital signal processing; Field programmable gate arrays; Radiation hardening; Antifuse-based FPGAs; DSPs; SET characterization and mitigation; hardening-by-design; heavy-ions; non-volatile FPGAs; radiation tests;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2085017
