Impact of Spacecraft Shielding on Direct Ionization Soft Error Rates for Sub-130 nm Technologies

Author

Pellish, Jonathan A. ; Xapsos, Michael A. ; Stauffer, Craig A. ; Jordan, Thomas M. ; Sanders, Anthony B. ; Ladbury, Raymond L. ; Oldham, Timothy R. ; Marshall, Paul W. ; Heidel, David F. ; Rodbell, Kenneth P.

Author_Institution

NASA Goddard Spaceflight Center, Greenbelt, MD, USA

Volume

57

Issue

6

fYear

2010

Firstpage

3183

Lastpage

3189

Abstract

We use ray tracing software to model various levels of spacecraft shielding complexity and energy deposition pulse height analysis to study how it affects the direct ionization soft error rate of microelectronic components in space. The analysis incorporates the galactic cosmic ray background, trapped proton, and solar heavy ion environments as well as the October 1989 and July 2000 solar particle events.

Keywords

aerospace components; avionics; galactic cosmic rays; integrated circuits; radiation effects; ray tracing; shielding; space vehicles; direct ionization soft error rates; energy deposition pulse height analysis; galactic cosmic ray background; microelectronic components; ray tracing software; solar heavy ion environment; spacecraft shielding impact; Error analysis; Ionization; Ray tracing; Solar radiation; Direct ionization; radiation transport; soft error rate; space environment;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2010.2084595

Filename

5658015