Title :
Impact of Spacecraft Shielding on Direct Ionization Soft Error Rates for Sub-130 nm Technologies
Author :
Pellish, Jonathan A. ; Xapsos, Michael A. ; Stauffer, Craig A. ; Jordan, Thomas M. ; Sanders, Anthony B. ; Ladbury, Raymond L. ; Oldham, Timothy R. ; Marshall, Paul W. ; Heidel, David F. ; Rodbell, Kenneth P.
Author_Institution :
NASA Goddard Spaceflight Center, Greenbelt, MD, USA
Abstract :
We use ray tracing software to model various levels of spacecraft shielding complexity and energy deposition pulse height analysis to study how it affects the direct ionization soft error rate of microelectronic components in space. The analysis incorporates the galactic cosmic ray background, trapped proton, and solar heavy ion environments as well as the October 1989 and July 2000 solar particle events.
Keywords :
aerospace components; avionics; galactic cosmic rays; integrated circuits; radiation effects; ray tracing; shielding; space vehicles; direct ionization soft error rates; energy deposition pulse height analysis; galactic cosmic ray background; microelectronic components; ray tracing software; solar heavy ion environment; spacecraft shielding impact; Error analysis; Ionization; Ray tracing; Solar radiation; Direct ionization; radiation transport; soft error rate; space environment;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2084595
