Title :
First Record of Single-Event Upset on Ground, Cray-1 Computer at Los Alamos in 1976
Author :
Normand, Eugene ; Wert, Jerry L. ; Quinn, Heather ; Fairbanks, Thomas D. ; Michalak, Sarah ; Grider, Gary ; Iwanchuk, Paul ; Morrison, John ; Wender, Stephen ; Johnson, Steve
Author_Institution :
Boeing Res. & Technol., Seattle, WA, USA
Abstract :
Records of bit flips in the Cray-1 computer installed at Los Alamos, NM, in 1976 lead to an upset rate in the Cray-1´s bipolar SRAMs that correlates with the single-event upsets (SEUs) being induced by the atmospheric neutrons.
Keywords :
SRAM chips; bipolar memory circuits; mainframes; neutron effects; Cray-1 bipolar SRAM; Cray-1 computer; atmospheric neutron; single-event upset rate; Computer performance; Neutrons; Radiation effects; SRAM chips; Single event upset; Atmospheric neutrons; SRAM chip; computer errors; computer performance; neutron radiation effects; single-event upset (SEU);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2083687
