DocumentCode :
1394586
Title :
Synchronization Techniques for Crossing Multiple Clock Domains in FPGA-Based TMR Circuits
Author :
Li, Yubo ; Nelson, Brent ; Wirthlin, Michael
Author_Institution :
Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA
Volume :
57
Issue :
6
fYear :
2010
Firstpage :
3506
Lastpage :
3514
Abstract :
Triple modular redundancy (TMR) is a widely used mitigation technique to protect FPGA circuits against single event upsets (SEUs). TMR, however, does not adequately protect signals that cross asynchronous clock domains. Signals which cross clock domains in TMR circuits may suffer from the combined effects of two failure modes: asynchronous sampling effects and SEUs. This paper analyzes and quantifies these problems. In addition, various solutions are proposed for designing safe synchronizers with TMR. Finally, the improvements in reliability provided by the proposed synchronizers are demonstrated by both mathematical modeling and fault injection testing on an FPGA circuit. It is shown that the proposed mitigated synchronizer designs provide between 6 and 10 orders of magnitude improvement in reliability compared to unmitigated designs.
Keywords :
asynchronous circuits; field programmable gate arrays; logic testing; radiation hardening (electronics); redundancy; reliability; synchronisation; FPGA-based TMR circuits; SEU; asynchronous sampling effects; failure modes; fault injection testing; field programmable gate arrays; mitigation technique; multiple clock domains; single event upsets; synchronization techniques; triple modular redundancy; Field programmable gate arrays; Reliability; Single event upset; Field programmable gate arrays; reliability; single event upset; synchronizer; triple modular redundancy;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2010.2086075
Filename :
5658028
Link To Document :
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