Title :
Pulsed laser validation of recovery mechanisms of critical SEEs in an artificial neural network system
Author :
Buchner, S. ; Olmos, M. ; Cheynet, Ph. ; Velazco, R. ; McMorrow, D. ; Melinger, J. ; Ecoffet, R. ; Muller, J.D. ; Ecoffet, R.
Author_Institution :
SFA Inc., Washington, DC, USA
fDate :
6/1/1998 12:00:00 AM
Abstract :
A pulsed laser was used to inject errors into an electronic system consisting of a number of different integrated circuits functioning as a digital version of an artificial neural network. The results confirm that the system as a whole can operate autonomously in the radiation environment of space. Additional work was done to characterize the effects of the upsets on the output of the artificial neural network
Keywords :
errors; laser beam effects; neural chips; artificial neural network; critical SEE; digital integrated circuit; electronic system; error injection; pulsed laser irradiation; recovery; space radiation environment; Aerospace engineering; Artificial neural networks; Extraterrestrial measurements; Laboratories; Life estimation; Optical pulses; Pulse measurements; Redundancy; Single event upset; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
