Author_Institution :
Nat. Key Lab. of Sci. & Technol. on Commun., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
Notice of Violation of IEEE Publication Principles
"Joint Redundant Residue Number Systems and Module Isolation for Mitigating Single Event Multiple Bit Upsets in Datapath"
by Lei Li and Jianhao Hu,
in the IEEE Transactions on Nuclear Science, vol.57, no.6, Dec. 2010, pp. 3779-3786
After careful and considered review of the content and authorship of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE\´s Publication Principles.
This paper contains substantial duplication of original text from the paper cited below. The original text was copied without attribution (including appropriate references to the original author(s) and/or paper title) and without permission.
Due to the nature of this violation, reasonable effort should be made to remove all past references to this paper, and future references should be made to the following articles:
"Multiple Error Detection and Correction Based on Redundant Residue Number Systems"
by Vik Tor Goh and M.U. Siddiqi,
in the IEEE Transactions on Communications, vol.56, no.3, March 2008, pp.325-330
"A Coding Theory Approach to Error Control in Redundant Residue Number Systems. I: Theory and Single Error Correction"
by H. Krishna, K-Y. Lin, and J-D. Sun,
in the IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, vol.39, no.1, Jan 1992, pp.8-17
In this paper, we propose a joint scheme which combines redundant residue number systems (RRNS) with module isolation (MI) for mitigating single event multiple bit upsets (SEMBUs) in datapath. The proposed hardening scheme employs redundant residues to improve the fault tolerance for datapath and module spacings to guarantee that SEMBUs caused by charge sharing do not propagate among the operation channels of different moduli. The features of RRNS, such as independence, parallel and error correction, are exploited to establish the radiation h- rdening architecture for the datapath in radiation environments. In the proposed scheme, all of the residues can be processed independently, and most of the soft errors in datapath can be corrected with the redundant relationship of the residues at correction module, which is allocated at the end of the datapath. In the back-end implementation, module isolation technique is used to improve the soft error rate performance for RRNS by physically separating the operation channels of different moduli. The case studies show at least an order of magnitude decrease on the soft error rate (SER) as compared to the NonRHBD designs, and demonstrate that RRNS+MI can reduce the SER from 10-12 to 10-17 when the processing steps of datapath are 106. The proposed scheme can even achieve less area and latency overheads than that without radiation hardening, since RRNS can reduce the operational complexity in datapath.
Keywords :
isolation technology; radiation hardening (electronics); redundancy; residue number systems; charge sharing; correction module; fault tolerance; joint redundant residue number systems; module isolation; module isolation technique; nonRHBD designs; radiation environments; radiation hardening architecture; single event multiple bit upsets; soft error rate performance; Fault tolerance; Radiation hardening; Charge sharing; redundant residue number systems (RRNS); single event multiple bit upsets (SEMBUs);
