A new approach to modelling radiation noise in CCDs

Author

Chugg, Andrew ; Hopkinson, Gordon

Author_Institution

Radiat. Effects Group, Matra BAe Dynamics, Brisol, UK

Volume

45

Issue

3

fYear

1998

fDate

6/1/1998 12:00:00 AM

Firstpage

1518

Lastpage

1523

Abstract

The energy depositions reported by Monte Carlo electron-photon radiation transport codes are subject to a random error due to the finite number of particle histories used to generate the results. These statistical variations, normally a nuisance, may also be identified with the real radiation noise effects experienced by CCD pixels in persistent radiation environments. This paper explores the practicability of such radiation noise modelling by applying the ACCEPT code from the ITS suite to the case of a shielded CCD exposed to an electron flux. The results are compared with those obtained in a subsequent electron irradiation of the CCD by a Van de Graaff accelerator

Keywords

Monte Carlo methods; charge-coupled devices; electron beam effects; semiconductor device models; semiconductor device noise; CCD; ITS ACCEPT; Monte Carlo electron-photon radiation transport code; Van de Graaff accelerator; electron irradiation; energy deposition; model; radiation noise; Charge coupled devices; Electrons; Geometry; History; Monte Carlo methods; Noise level; Probability distribution; Radiation effects; Testing; Working environment noise;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.685233

Filename

685233