• DocumentCode
    1394946
  • Title

    Improved blades for RF testing at wafer level

  • Author

    Tunaboylu, B.

  • Author_Institution
    Dept. of Ind. Eng., Istanbul Sehir Univ., Uskudar-Istanbul, Turkey
  • Volume
    47
  • Issue
    25
  • fYear
    2011
  • Firstpage
    1396
  • Lastpage
    1398
  • Abstract
    An improved design for a blade utilised in a probe card is presented. The comparison is made with a current blade design and prototype test cards were manufactured for the study. Measurement results on S-parameters are reported on test cards with the new design and new blade material.
  • Keywords
    blades; circuit testing; printed circuit accessories; printed circuits; probes; test equipment; RF testing; S-parameters; blade design; blade material; probe card; prototype test cards; wafer level;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2011.2563
  • Filename
    6099142
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1394946