Title :
InGaN-based blue laser diodes
Author_Institution :
Dept. of Res. & Dev., Nichia Chem. Ind. Ltd., Tokushima, Japan
fDate :
6/1/1997 12:00:00 AM
Abstract :
The continuous-wave (CW) operation of InGaN multiquantum-well (MQW) structure laser diodes (LDs) was demonstrated at room temperature (RT) with a lifetime of 100 h. The threshold current and the voltage of the LDs were 50 mA and 5 V, respectively. The threshold current density was 8.8 kA/cm2. The carrier lifetime and the threshold carrier density were estimated to be 3.5 ns and 1.8×1020/cm3, respectively. The Stokes shift of the energy difference between the absorption and the emission energy of the InGaN MQW LD´s were 140 meV. Both spontaneous and stimulated emission of the LD´s originated from this deep localized energy state which is equivalent to a quantum dot-like state. From the measurements of gain spectra and an external differential quantum efficiency dependence on the cavity length, the differential gain coefficient, the transparent carrier density, threshold gain and internal loss were estimated to be 5.8×10-17 cm2, 9.3×10 19 cm-3, 5200 cm-1, and 43 cm-1 respectively
Keywords :
III-V semiconductors; carrier density; carrier lifetime; current density; gallium compounds; indium compounds; quantum well lasers; spontaneous emission; stimulated emission; 100 h; 140 meV; 3.5 ns; 5 V; 50 mA; CW lasers; InGaN; InGaN MQW LD´s; InGaN multiquantum-well laser diodes; InGaN-based blue laser diodes; Stokes shift; absorption energy; carrier lifetime; cavity length; continuous-wave operation; deep localized energy state; differential gain coefficient; emission energy; external differential quantum efficiency dependence; gain spectra; quantum dot-like state; room temperature; spontaneous emission; stimulated emission; threshold carrier density; threshold current; threshold current density; threshold voltage; Absorption; Charge carrier density; Charge carrier lifetime; Diode lasers; Life estimation; Lifetime estimation; Quantum well devices; Temperature; Threshold current; Threshold voltage;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/2944.640626