DocumentCode :
1395117
Title :
Electrooptic coefficient variation in proton exchanged and annealed lithium niobate samples
Author :
Narayan, Raghuram
Author_Institution :
Opt. Sci. Center, Arizona Univ., Tucson, AZ, USA
Volume :
3
Issue :
3
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
796
Lastpage :
807
Abstract :
A new technique to measure relative changes in the electrooptic (EO) coefficient of a material is presented. It is used to measure the spatial variation of the EO coefficient in x-cut lithium niobate caused by the annealed proton exchange technique. The lithium niobate samples are proton exchanged at different temperatures for varying times. The measurements presented indicate significant degradation of the EO coefficient immediately after the proton exchange process. The samples are annealed at 375°C to enable recovery of the EO coefficient. Samples processed in benzoic acid for 30 min at a temperature of 240°C show immediate recovery of the EO coefficient upon thermal annealing. Samples processed in benzoic acid for 5 h at a temperature of 180°C show a slower recovery of the EO coefficients requiring longer periods of thermal annealing even though the diffusion depth is the same as in the previous case. Samples processed in benzoic acid for 5 h at a temperature of 240°C exhibit significant cracking which worsens progressively upon thermal annealing. The EO coefficient cannot be restored in all areas even after a long 8-h anneal step
Keywords :
annealing; diffusion; electro-optical devices; ion exchange; lithium compounds; optical materials; 180 C; 30 min; 375 C; 5 h; 8 h; EO coefficient; LiNbO3; anneal step; annealed lithium niobate samples; annealed proton exchange technique; benzoic acid; cracking; diffusion depth; electrooptic coefficient variation; immediate recovery; proton exchange process; proton exchanged; spatial variation; thermal annealing; varying times; x-cut lithium niobate; Annealing; Electromagnetic waveguides; Electrooptical waveguides; Lithium niobate; Optical films; Optical interferometry; Optical modulation; Optical waveguides; Protons; Temperature;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/2944.640634
Filename :
640634
Link To Document :
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